Abstract
A quick and exact imaging method for one-dimensional layered rough surfaces is proposed in this paper to study the scattering characteristics of a layered medium that exists widely in nature. The boundary integral equations of layered rough surfaces are solved by using the propagation-inside-layer expansion combined with the forward and backward spectral acceleration method (PILE+FB-SA), and the back scattering data are obtained. Then, a conventional synthetic aperture radar (SAR) imaging procedure called back projection method is used to generate a two-dimensional (2D) image of the layered rough surfaces. Combined with the relative dielectric permittivity of realistic soil, the random rough surfaces with Gauss spectrum are used to simulate the layered medium with rough interfaces. Since the back scattering data are computed by using the fast numerical method, this method can be used to study layered rough surfaces with any parameter, which has a great application value in the detection and remote sensing areas.
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