Abstract

Parameters of identification of surface crack signals Kh and Kw are proposed based on features of the Fourier spectrum and the wavelet spectrogram of modulation impulses defined using an eddy current sensor. Probability performances of defect detection using both spectral and wavelet methods are defined depending on the probability of a false alarm. Simulation data revealed that both methods have a good ability to identify short and shallow surface cracks. The wavelet method has the best probability of defect detection compared with the spectral method in case intensive noise. The spectral method is faster and preferable at small noise levels.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.