Abstract

The Internet of Things (IoT) proposes to transform human civilization so that it is smart, practical, and highly efficient, with enormous potential for commercial as well as social and environmental advantages. Reliability is one of the major problems that must be resolved to enable this revolutionary change. The reliability issues raised with specific supporting technologies for each tier according to the layered IoT reliability are initially described in this research. The research then offers a complete review and assessment of IoT reliability. In this paper, various types of reliability on the IoT have been analyzed with each layer of IoT to solve the issues of failure rates, latency, MTTF, and MTBF. Each parameter has a certain classification and perception as well as enhancement in efficiency, accuracy, precision, timeliness, and completeness. Reliability models provide efficient solutions for different IoT problems, which are mirrored in the proposed study and classified with four types of reliabilities. The field of IoT reliability exploration is still in its initial phases, despite a sizable research record. Furthermore, the recent case study of CHISS is elaborated with discovered behaviors including brand-new aspects such as the multifaceted nature of evolving IoT systems, research opportunities, and difficulties.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.