Abstract
Growing density and high gate count of todays VLSI-circuits impose strong limitations on classical methods to determine the reliability of these circuits /1,2,3,4/. In order to overcome this problem and to include all effects which are due to the functionality of a complex circuit and all parasitic phenomena given by timing, technology etc. /5/,a method to measure reliability of microprocessors on a functional basis is described. The instruction set of the device is used as description. Applying stimuli and comparison of responses is done by a functional self-test program. A small test equipment is used for control of the self-testing procedure and the setting of parameters.
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