Abstract
The effect of thickness on residual voltage ratio K/sub r/ of ZnO varistors is experimentally studied, which shows that a dimensional effect of K/sub r/ also exists. The relations are experimentally investigated between residual voltage ratio K/sub r/ and breakdown strength E/sub 1mA/, and K/sub r/ and microstructural parameters. It is shown that K/sub r/ decreases with E/sub 1mA/, and increases with average grain size /spl mu/. An integrated parameter the product of average grain size /spl mu/ and grain size variance /spl sigma//sup 2/ is found to be a better parameter to show the relation between electrical properties and microstructure of ZnO varistors. A microstructural model for simulation is proposed. By using computer, the relations are simulated between K/sub r/ and thickness, K/sub r/ and average grain size /spl mu/ & K/sub r/ and the product /spl sigma//sup 2//spl mu/. The simulated results are consistent with experimental ones.
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