Abstract
A novel method of measuring the refractive-index profile of deep multimode planar waveguides is described. Unlike in mode spectroscopy, several modes are excited simultaneously by a prism coupler. Superposition of the modes forms a guided beam that refracts continuously inside the graded-index waveguide and reflects periodically from the waveguide surface. Measurement of the periodicity as a function of the excitation angle enables one to calculate the refractive-index profile of the waveguide.
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