Abstract
AbstractUsing polarized-neutron reflectivity, one can determine the layer-averaged magnetic structure of films and multilayers with exquisite precision. By employing the closely related phenomenon of grazing-angle diffraction, it is possible to obtain information about the in-plane structure in interfacial layers some tens of Ångstroms thick. We have used polarized-beam methods to study the Y/Gd interface using both reflectivity and grazingangle diffraction and discuss the status of these experiments.
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