Abstract
Preliminary analysis has been done on the reflectance of sputtered Indium Tin Oxide (ITO) layers. The analysis is done for two different types of layers which is the directly sputtered ITO films and the treated ITO films. In both type of the film it is divided into the thickness of the layer and deposition time. Analysis is done using Perkin Elmer Lambda 950 UV/Vis/NIR Spectrophotometer. The working spectral range is from 250 nm to 800 nm (for transmittance), covering the ultra-violet (UV) and visible spectrum. Results shows thatthe directly deposited thin ITO films had lower reflectance compared to the thick films. The reflectance of the thick films with three and four layers was high (95%) compared to the rest of the films. The treated films produce very low reflectance.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
