Abstract
Recording properties of CoCrPt thin films sputter-deposited on polymeric substrates at room temperature were investigated. Typical frequency spectra of the readback signal from sputtered tapes at various recording densities revealed an appreciable amount of modulation noise, despite the fact that the sputtered tape is expected to be smooth and conformal with the substrate. Atomic force microscopy images suggest the modulation noise, present as side bands about the signal peak, is primarily due to the roughened polymeric substrate. The nonlinear partial erasure method was used to measure the sharpness of recorded transitions via the frequency domain one-dimensional/three-dimensional method. Intertransition interactions occurred at a linear density of 130 kfci, which corresponds to a transition length parameter (πa) of 195 nm. This rather large value of transition length is attributed to exchange coupling between grains in the media, suggesting inadequate Cr segregation due to the low-temperature deposition needed to avoid substrate damage.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
