Abstract
Iam writing this column with the fresh memory of the 2008 I2MTC (International Instrumentation and Measurement Technology Conference). This year the conference was held in Victoria, BC, Canada, from May 12-15. It is a very nice memory, not only because of the magnificent venue and organization, but also for the excellent technical program; that is the most important side of a scientifi c and technical event. So, let me publicly thank the General Chair, Bob Rassa, and the Technical Program Co-Chairs, Emil Petriu, Abdulmotaleb El Saddik, Kim Fowler and Ferdinanda Ponci for the excellent conference they organized.
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