Abstract
In the past few years the integral-imaging, or lightfield, concept has been applied successfully to microscopy. More specifically, in the case of fluorescent samples integral, or lightfield, microscopy offers the advantage of capturing the 3D information in a single shot. Due to its potential utility integral microscopy is now facing many challenges, like improving the resolution and depth of field, the development and optimization of specially-adapted reconstruction algorithms, or the search of applications in which lightfield microscopy is superior to existing techniques. This contribution is devoted to review the recent advances of integral microscopy and enunciate the right questions about the progress of the technique.
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