Recent Advances in Texture Measurement Using Two-Dimensional Detector

Abstract

The two most important advances in two-dimensional x-ray diffraction (XRD2) are area detectors for collecting 2D diffraction patterns and algorithms in analyzing 2D diffraction patterns. The VÅNTEC-500 area detector represents the innovation in detector technology. The combination of its large active area, high sensitivity, high count rate, high resolution and low noise, makes it the technology of choice for many applications, including texture analysis. A 2D diffraction pattern contains information in a large solid angle which can be described by the diffraction intensity distribution in both 2θ and g directions. The texture information appears in a 2D diffraction pattern as intensity variation in g direction. The intensity variation represents the orientation distribution of the crystallites in a polycrystalline material. The diffraction vector orientation regarding to the sample orientation can be obtained by vector transformation from the laboratory space to the sample space. The fundamental equations for texture analysis are derived from the unit vector expression in the sample space.