Abstract
We report herein an alternative high-speed scanning force microscopy method in the contact mode based on a resonance-type piezoelectric bimorph scanner. The experimental setup, the modified optical beam deflection scheme suitable for smaller cantilevers, and a high-speed control program for simultaneous data capture are described in detail. The feature of the method is that the deflection and friction force images of the sample surface can be obtained simultaneously in real time. Images of various samples (e.g., a test grating, a thin gold film, and fluorine-doped tin oxide-coated glass slides) are acquired successfully. The imaging rate is 25 frames per second, and the average scan speed reaches a value of approximately 2.5 cm/s. The method combines the advantages of both observing the dynamic processes of the sample surface and monitoring the frictional properties on the nanometer scale.PACS07.79.Lh; 07.79.Sp; 68.37.Ps
Highlights
Experimental methods for nanotribology studies by means of atomic force microscopy (AFM) have been developed rapidly during the past decade [1,2,3]
We present an alternative high-speed scanning force microscopy (HSSFM) method based on a resonance-type piezoelectric bimorph scanner, which has the ability to provide real-time deflection and friction force images in the contact mode simultaneously
We can conclude that the topography and the fictional properties of materials can be detected in real time with our HSSFM method
Summary
Experimental methods for nanotribology studies by means of atomic force microscopy (AFM) have been developed rapidly during the past decade [1,2,3]. AFM or friction force microscopy (FFM) [4], which is known as one of AFM's derivative technologies, has been widely used for detecting frictional properties of sample surfaces with extraordinary resolution [5,6,7,8]. In FFM, a sharp tip that is at the end of a cantilever contacts the sample surface slightly. By using the optical beam deflection (OBD) technique, the normal and the lateral forces detected by the tip can be measured simultaneously [10,11]. With these characteristics of FFM, various novel phenomena are accessible to researchers, such as the observation of
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