Abstract
In-situ stress determinations by X-ray diffraction have been performed during pure iron oxidation (p(O 2 ) = 2 x 10 -3 Pa, T = 800°C). On yttrium implanted specimens the stress level is close to zero before oxidation. On CeO 2 coated specimens, the initial compressive stress due to surface polishing is not modified by the coating. During oxidation, the in-situ compressive stress value determined in the Fe (1-x) O scale, is not strongly dependent upon the reactive element nature. Nevertheless, the stress evolution during cooling and residual stresses determined after cooling to room temperature are very different. Blank and CeO 2 coated specimens show relatively high compressive stresses whereas implanted samples show low tensile residual stresses.
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