Abstract
We present a technique for rapid measurement of surface forces using an ac force microscope. Measurement of both the amplitude and relative phase of a cantilever probe allows simultaneous and rapid determination of static and velocity-dependent forces of order nN over nm length scales. Using this technique, we have also demonstrated the high lateral spatial resolution of the force microscope in the measurement of surface forces.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
