Rapid determination of residual stress profiles in ferrite phase of cold-drawn wire by XRD and layer removal technique

Abstract

A cost effective and simple approach on residual stress evaluation of cold-drawn pearlitic steel wire was proposed, on a basis of the AST XSTRESS 3000 X-ray system and layer removal technique. The system could accomplish stress measurement with high accuracy in a shorter time than conventional laboratory X-ray diffractometer. The stress profiles in ferrite phase of cold-drawn wires were quantitatively determined by extending the layer removal technique to the whole section of wires. It was observed that the cold-drawn wires were in tension at the surface and were compressive at the center along the axial direction, while there was near-zero intensity of stress level in the rods before cold drawing.