Abstract
A simple approach for the screening of oxygen evolution reaction (OER) electrocatalyst arrays by scanning electrochemical microscopy (SECM) in the substrate generation/tip collection (SG/TC) mode is described. The methodology is based on the application of a series (9–10 replicates) of double-potential steps to a catalytically active substrate electrode, which is switched between potentials where it displays OER activity and inactivity. With an SECM tip coaligned to a given electrocatalyst spot, the dual potential step is applied for a relatively short time in order to restrict the growth of the resulting O2 diffusion layer. The SECM is then able to measure the O2 produced while the potential sequence prevents the overlap of the diffusion layer from neighboring spots. With this approach, each spot of material in an array of Ir:Sn oxide compositions (disk shaped, about 150 μm radius) was examined independently at a constant distance. The method was tested for a series of oxygen evolution catalysts made of ...
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