Abstract

A rapid method for the characterization of hydrogen evolution catalysts by scanning electrochemical microscopy (SECM) with decreased H2 diffusion layer overlap is introduced. The double-pulsed substrate generation/tip collection (SG/TC) mode was employed by switching the substrate electrode potential between an inactive potential and an HER active potential while the tip electrode was moved to each catalyst spot and collected the H2. The optimal pulse potential and pulse width were selected using 3D COMSOL simulation. The reliability of this method was confirmed by the good agreement with the results obtained by the traditional SECM screening techniques. Keywords—scanning electrochemical microscopy; energy materials; HER catalysts; substrate generation-tip collection Mode.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.