Abstract
Aim of this work is to examine the over-voltage protection under the ionizing radiation influence. The use of modern electronic devices (nuclear, military and space technology) in the conditions of ionizing radiation brings up the question of radioactive resistance of electronic components and over-voltage protection components. The question of reliability of these components under the influence of ionizing radiation is also a relevant one. The entire effects of radiation, which cause the irreversible changes of the material characteristics, are defined as the dosage or integral effects. The resistance of the over-voltage material (the Transient Suppresser Diodes (TSD), Metaloxide Varistors, Gas Filled Surge Arresters (GFSA) and Polycarbon Capacitors) subjected to influence of n +γ radiation caused by californium source was examined in order to determine the radiation effects. It was determined that TSD are highly sensitive to the radiation. The radiation effects on Metaloxide Varistors are similar to the effects on the TSD. GFSA showed the temporary characteristics improvement. It was determined that the Polycarbon Capacitor capacity decreases under the influence of radiation. The obtained results are explained theoretically.
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