Abstract

A microwave domain characterization approach is proposed to determine the properties of high quality factor optical resonators. This approach features a very high precision in frequency and aims to acquire a full knowledge of the complex transfer function (amplitude and phase) characterizing an optical resonator using a microwave vector network analyzer. It is able to discriminate between the different coupling regimes, from the under-coupling to the selective amplification, and it is used together with a model from which the main resonator parameters are extracted, i.e. coupling factor, intrinsic losses, phase slope, intrinsic and external quality factor.

Highlights

  • To cite this version: Zeina Abdallah, Y.G

  • Many different resonator technologies can be involved in these applications, with some of which featuring a ultra-high Q factors, such as: Ultra Low Expansion (ULE) Fabry-Perot resonators[9] (Q ~ 1010), Whispering Gallery Modes (WGM) resonators, e.g. silica spheres[10] (Q ~ 109) or polished monocrystalline disks[11] (Q ~ 108 to 1010), active or passive fiber ring resonator[12] (Q ~ 108 to 1010)

  • This paper demonstrates that, in addition to the amplitude response of the resonator, which gives access to the measure of several parameters like the free spectral range (FSR), the Δf​1/2 and the quality factor, this technique is able to simultaneously characterize the resonator phase response thanks to a vector network analyzer (VNA)

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Summary

Introduction

To cite this version: Zeina Abdallah, Y.G. Boucher, Arnaud Fernandez, Stéphane Balac, Olivier Llopis. Radio frequency spectral characterization and model parameters extraction of high Q optical resonators. HAL is a multi-disciplinary open access archive for the deposit and dissemination of scientific research documents, whether they are published or not. L’archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des établissements d’enseignement et de recherche français ou étrangers, des laboratoires publics ou privés. A microwave domain characterization approach is proposed to determine the properties of high quality factor optical resonators. This approach features a very high precision in frequency and aims to acquire a full knowledge of the complex transfer function (amplitude and phase) characterizing an optical resonator using a microwave vector network analyzer. A detailed knowledge of their properties is essential to accurately model these devices and to achieve better performance

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