Abstract
System-level radiation testing of electronics is evaluated, based on test examples of the System-in-Package (SiP) module irradiations. Total ionizing dose and single event effects tests are analyzed to better understand the opportunities and limitations of the system-level approach in the context of the radiation qualification of electronics. Impact on the SiP product development is discussed.
Highlights
We could observe a huge increase in the number of small/micro/nano-satellites that were launched and that are built of non-space grade electronics, but from COTS components
The space radiation may be a source of cumulative effects (such as total ionizing dose (TID) or displacement damage) and single event effects (SEE), and in general may lead to decreased performance of specific functions, temporal malfunctions or critical failure and loss of mission
The main goal of this paper is to present opportunities and limitations related to the radiation qualification of the System-in-Package (SiP) modules using system-level tests
Summary
We could observe a huge increase in the number of small/micro/nano-satellites that were launched and that are built of non-space grade electronics, but from COTS (commercial off the shelf) components. The space radiation may be a source of cumulative effects (such as total ionizing dose (TID) or displacement damage) and single event effects (SEE), and in general may lead to decreased performance of specific functions, temporal malfunctions or critical failure and loss of mission. In this context, the goal of RHA is to ensure that all the potentially radiation-sensitive units of a space system (including the space system itself) will meet their design specifications up to the end of the targeted mission [1]. Simplified approaches are searched for, including testing of the reduced number of components in the system (e.g., the most critical components only) and system-level testing [3]
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