Abstract
We investigated Nb/Ni bilayers prepared by DC magnetron sputtering on glass substrates. The quality of the films was characterized by small-angle X-ray diffraction analysis. The thickness of the layers was determined by the Rutherford Back Scattering (RBS) technique. We observed distinct oscillations of the superconducting critical temperature for specimens with constant Nb layer thickness upon increasing the thickness of the Ni layer. The results are interpreted in terms of Fulde-Ferrell-Larkin-Ovchinnikov (FFLO) like inhomogeneous superconducting pairing in the ferromagnetic Ni layer.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
