Abstract
The performances of laser diodes operating in continuous wave regime, in terms of lifetime, output power and emission wavelength, are strongly limited by internal Joule heating. Using a CCD-based thermoreflectance system, we have obtained thermal images of laser diodes operating at various biases. Separate calibration procedures have been implemented to obtain quantitative temperatures on the gold-covered ridge waveguides and on the emission facets, thus providing a complete picture of the surface temperature of the device. The continuity of the obtained temperatures is a strong indication of the consistency of the measurements. Even in quasi-static regime, temperature inhomogeneities have been detected, which might lower the permanent damage threshold of the devices.
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