Abstract
A general purpose multiline, mean‐normalized‐intensity (MNI) method, derived from a procedure proposed in the literature, was applied to puase‐composition analysis of powders containing α‐ and β‐silicon nitride and small amounts of free silicon. Results obtained using peak and integrated intensities to derive the MNI values for the phases were compared with values determined by Rietveld pattern fitting according to error assessments based on the MNI standard deviation estimates calculated by assuming that the MNI data for each phase follow Gaussian statistics, and Rietveld‐derived standard deviations. The MNI results for the integrated intensities agreed reasonably with the Rietveld determinations and were discernibly superior to results obtained with peak intensities. The study demonstrated the power of the MNI method as a general tool for materials analysis.
Published Version
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