Abstract
In this contribution we present the potential of digital pulsed force mode (DPFM) atomic forcemicroscopy (AFM) formapping the local mechanical properties to surface topology. In the first part, we review the pulsed force mode principles and compare this mode with other common modes of dynamic AFM operation. Then, we present an overview of the different model for tip–sample interaction based on continuum mechanics theories. In a general view, we then show how the huge amount of data that is acquired during DPFM imaging is stored and how it can be processed in order to provide insight into local mechanics of the sample surfaces. Applications of this measurement technique show the possible impact of DPFM on condensed soft matter samples as well as possible extensions towards measurements of the in-plane mechanics of the tip and the surface. All mechanical DPFM data were analyzed on the basis of continuum mechanical models. We conclude our contribution with an overview of this technique and its benefits for lateral compositional mapping.
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