Abstract
Various possibilities of manual and automatic image analysis produce a large number of data for the quantitative description of the geometrical features in materials microstructures. These are essential to gain a deeper understanding of the relationships between process parameters and in-use properties of technical materials. Some of the techniques presently available are discussed. A limited but universally applicable set of parameters seems to be the optimum choice for solving most of the practical problems. This set is based on stereological principles which allow to convert simple measurements in plane sections into global microstructural parameters, i.e. quantitative descriptors of the average properties of three-dimensional geometry. Studies of correlations between microstructure and properties based on these parameters and related stereometric measurements are of interest since they can often be interpreted on the basis of scientific reasoning while empirical correlations using less well defined parameters usually can not. Examples of successful approaches are reviewed which demonstrate that these parameters are the best choice to predict and control properties which are sensitive to microstructure.
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