Abstract
Quantitative microstructure investigations on microstructural changes during creep of an intermetallic near-γ TiAl alloy are presented. The duplex microstructure of the alloy, consisting of lamellar (α 2 + γ) and equiaxed γ-grains, was quantitatively characterised in the initial state and after creep deformation. Backscattered images were taken in the scanning electron microscope which has the advantage that (i) the TiAl (γ) and Ti 3 Al (α 2 ) phases can be easily distinguished due to their different brightness in the backscatter mode and (ii) a crystallographic contrast component allows the distinguish between γ-grains of different orientation as well as the identification of twins within the γ-grains.
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