Abstract
Results of optical carrier lifetime measurements like carrier density imaging significantly depend on surface conditions of the sample under test. Rough or textured surfaces have a severe impact on the measurement quality since they cause blurring and overestimation of the lifetime measurement. We propose a correction method for both, the adjustment of the absolute value and the restoration of the spatial distribution of the recombination lifetime. The absolute value is corrected by taking the emissivity of the sample into account. The unblurred signal distribution is obtained by mathematical deconvolution via Wiener filtering. For this purpose an appropriate point spread function is experimentally determined.
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