Abstract
To facilitate calculation of substrate roughness contributions to spectroscopically determined molecular orientation at surfaces, a scale-dependent method of determining the local surface normal tilt angle distribution is proposed and compared with experiment. Atomic force micrographs of fused silica were analyzed to determine the surface tilt angle distributions from the surface gradient. Good correlation between experiment and theory was observed for lateral separations comparable to the probe tip diameter. To overcome the tip-limited lateral resolution of atomic force microscopic roughness measurements, fractal analysis was used to extrapolate roughness values to molecular scales.
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