Abstract
With the advances in instrumentation and the capability of point-to-point resolution better than 0.2 nm, high resolution electron microscopy (HREM) is becoming more widely used for the quantitative study of both surfaces and internal interfaces. The elegance of the technique lies in its ability to deduce atomic-scale information on a localized scale. Without the proper analysis, however, HREM images can easily be misinterpreted. We investigate the considerations necessary for quantification of HREM images, using the measurement of the grain boundary volume expansion via the lattice fringe displacement technique as an example. The volume expansion, a parameter directly related to the grain boundary energy, is measured (in length units on the order of tenths of Å) as a rigid body translation normal to the boundary. It can be determined experimentally using statistical techniques which locate and fit the peak and valley positions in an experimental HREM image such that a direct measurement of the lattice fringe displacements is made.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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