Abstract
Sensitometers for X-ray films are used for the purposes of quality assurance in conventional X-ray diagnostic imaging to check film processing. In this study a spectrometer is presented which is capable of measuring the emission spectra of such sensitometers with adequate accuracy. In particular, the device is suitable to check whether the emission spectra meet the requirements of DIN 6868 part 55. The measurement principle and the calibration of the spectrometer are described and results obtained for two Victoreen Sensitometers are presented and discussed.
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