Abstract
A quadrature phase-shifted white-light interferometry is demonstrated to interrogate short-cavity extrinsic Fabry–Perot interferometric (EFPI) sensors. The absolute cavity length of an EFPI can be recovered by constructing two quadrature signals using the white-light spectrum of the EFPI. Experimental results show that the measurement resolution can be improved, and a linear output is obtained when interrogating an EFPI temperature sensor. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:1011–1015, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.25920
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