Abstract
The nanosecond pulsed MeV ion beam with the variable repetition rate was obtained by chopping ion beams from a Van de Graaff. The ion beam pulse radiolysis system with an optical emission spectroscopy was constructed, where time profiles are recorded by a photon counting technique with a coincidence method. By using this system, time profiles of the excimer fluorescence from polystyrene thin films excited by He + impact were measured, and were compared with those by electron pulse radiolysis in conjunction with the results by the product analysis in ion beam, electron beam, and γ-ray radiolysis experiments.
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Schedule a callMore From: International Journal of Radiation Applications & Instrumentation. Part C, Radiation Physics & Chemistry
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