Abstract
When the imprecise reliability of generalized gates is applied to the gate-level or high-level circuits, the errors could be easily over enlarged for the scale effect and other reasons, which leads to unreliable results. In this paper, the PTM model, which the effectiveness was proved by accurate gate-level circuit reliability estimation, was chosen to accurately calculate the structure reliability of generalized gates at the transistor-level; the structure logistic abstract of transistor-level generalized gates is analyzed and transformed into the style of gate-level structure logistic abstract having the same function with the pre-transform one; the failure points of circuit components and the main fault modes are extracted, and the corresponding probabilistic transfer matrixes oriented to faults are constructed; according to the characteristics of series-parallel circuit components, the structure reliabilities of transistor-level generalized gates are calculated by the gate-level PTM method under the fault conditions on input signals. Simulation results for typical generalized gates demonstrate the effectiveness of the proposed method; furthermore, the relation between generalized gates reliability and these main types faults is analyzed, and some interesting results are got.
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