Abstract
We report the properties of hole-overdoped and underdoped YBa2Cu3O7−x (YBCO) grain-boundary junctions (GBJ) on the 24° tilt SrTiO3 (100) bicrystals as a function of temperature and junction width. Epitaxial thin films of YBCO, Y0.7Ca0.3Ba2Cu3O7−y (Co-YBCO) were deposited by pulsed laser deposition, and the GBJs were fabricated by standard photolithography with argon ion-milling. We measured the IcRn products of ∼ 1.2 mV for Ca-YBCO and ∼ 0.3 mV for Co-YBCO GBJ at 27 K. Critical current densities(Jc) of the junctions were 1.4×103 and 3.0x104 A/cm2 at 27 K for the Ca- and Co-YBCO GBJs, respectively. This is explained in terms of a weak-link behavior at the grain-boundaries in comparison with the bulk properties of the doped YBCO films.
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