Abstract
This chapter covers some of the recent advances and applications of the surface Fourier transform infrared (FT-IR) spectroscopy in characterizing latex systems. A particular emphasis is given to the recent studies on the behavior of surfactants in latex films as a result from the externally applied stresses and surface tension differences. Photoacoustic (PA) and attenuated total reflectance (ATR) Fourier transform infrared (FT-IR) spectroscopy are used to monitor and characterize sodium dioctyl-sulfosuccinate/ ethyl acrylate/methacrylic acid (SDOSS/EA/MAA) copolymer latex films at both the film-air and film-substrate interfaces. The distribution of surfactant at the interfaces depends upon the water flux out of the film in the early stages of film formation and the surface tension of a substrate. Mechanical elongation of the latex films also influences the surfactant distribution across the film.
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