Abstract
Differential extended X-ray absorption fine structure (DiffEXAFS) is a novel technique for the study of small atomic strains. Here the development of this technique to the measurement of thermally induced strain is presented. Thermal DiffEXAFS measurements have been performed on alpha-Fe and SrF(2), yielding alpha = (11.6 +/- 0.4) x 10(-6) K(-1) and (19 +/- 2) x 10(-6) K(-1), respectively. These are in good agreement with accepted values, proving the viability of the technique. Analysis has revealed sensitivity to mean atomic displacements of 0.3 fm.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
