Abstract
Principal angles of incidence and associated principal azimuths, at which incident linearly polarized light becomes circularly polarized upon reflection, are determined for an IR-transparent high-index Si film (of the proper thickness) which is deposited on a low-index SiO2 (glass) substrate at the near-IR wavelength λ = 1.55 μm. The results are substantially different from those reported by the author [Appl. Opt. 57, 9529–9532 (2018)] for the SiO2–Si (film-substrate) system at the same wavelength. The intensity reflectances for incident p- and s-polarized light, and the linear-to-circular polarization conversion efficiency are also calculated as functions of the principal angle.
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