Abstract
Electrical, magnetic and structural properties of the antiferromagnetic semiconductor Sr{sub 3}Fe{sub 2}O{sub 7} (Fe{sup 4+}, d{sup 4}) were probed by resistance, Moessbauer spectroscopy (MS) and X-ray diffraction (XRD) measurements to P {approximately} 40 GPa using diamond-anvil cells. A sluggish pressure-induced insulator-metal transition is observed with a clear incipient metallic state at P {ge} 20 GPa. The Fe(IV) 3d magnetic moments remain unaltered across the transition as deduced from MS, and XRD studies show no structural symmetry change to 40 GPa. The results are consistent with carrier delocalization due to p-p gap closure e.g., ligand-to-ligand charge transfer that does not involve the d-states and structural symmetry changes.
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