Position determination of scatter signatures – A novel sensor geometry

Abstract

A novel diffraction sensor geometry able to provide the diffraction pattern of a suspect material without prior knowledge of the samples location is introduced. The sensor geometry can also resolve diffraction patterns originating from multiple unknown materials overlapped along the primary X-ray beam path. This is achieved through tracking Bragg peak maxima that linearly propagate from the inspection volume at a series of X-ray detector positions. A series of simulations and experiments have been performed to verify this technique and provide an insight into its characteristics. Such a technique could have widespread appeal in the security industry. Areas of most relevance include the materials characterisation of volumes such as those prevalent in an airport screening environment or equally the rapid screening for illicit drugs trafficked through the postal system.