Abstract
The use of polarized Raman as a means for determining the growth direction in nanowires with rutile structure is described. One finds that polarization angle dependence of various phonon bands can vary greatly even for isomorphic structures such as SnO2, TiO2, and RuO2. As a result, different phonon modes act as the most structure-indicative modes for these three systems, as determined from the polarization angle dependence of their intensities. Polarized Raman measurements were carried out on a single tetragonal (rutile) SnO2 segmented nanowire with the microscale segments with a prismatic structure growing along [110]. We demonstrate how the calculated effect of the refraction inside the wire, which comes into play when the wire's effective diameter is significantly larger than the wavelength of the exciting light, is essential in explaining the experimental results.
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