Abstract
AbstractPMOD (Photochemical Metal Organic Deposition)-based DTFI (Direct Thin Film Imaging) methodology is a demonstrated means for patterning organic materials on flexible (plastic) substrates. This process is used to pattern 1-micron features at an aspect ratio of 8:1 using contact lithography. Use of oxygen plasma RIE etch to transfer the hard mask pattern to the organic material allows for good sidewall angle control. High etch selectivity between the novolac polymer and PMOD TiOX hard mask (< 800:1) makes the use of very thin hard masks (∼ 200 angstroms) to pattern thick organic films (<10 microns) possible. Selective removal of the PMOD TiOX (TiO2) hard mask makes this process amenable to patterning of functional organic structures fabricated from materials chosen for their desired properties (e.g., glass transition temperature (Tg), etch resisitance, optical properties, mechanical properties, etc.) not their ability to be photopatterned (e.g., photoresist).
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