Abstract
A quantitative PIXE method - based on an external beam facility - applicable to plant samples, is described in this work, along with the results obtained from the elemental analysis of leaves from nine different plants, commonly used for curative purposes in México. At room conditions, pellet formed samples from the leaves were irradiated with 3.55 MeV protons. A computer code called PIXCO, allowed us: a) to evaluate (and optimize) the experimental conditions previous to the irradiations, b) to obtain the Si(Li) detector efficiency calibration and, c) to transform the net areas of the characteristic X-ray peaks into absolute concentrations, considering the relevant physical parameters and statistical tests pertinent to a thick sample analysis. A sample doping procedure was followed to avoid problems related with beam charge integration, and with the aid of a proper reference material (IAEA standard), a calibration of the system was acquainted for. The concentrations obtained, have an estimated precision of less than 15% for most of the elements analyzed.
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