Abstract
Investigation of the physical properties of carbon nanowall (CNW) films is carried out in correlation with the growth time. The structural, electronic, optical and electrical properties of CNW films are investigated using electron microscopy, Raman spectroscopy, X-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, UV–Vis spectroscopy, Hall Effect measurement system, Four Point Probing system, and thermoelectric measurements. Shorter growth time results in thinner CNW films with a densely spaced labyrinth structure, while a longer growth time results in thicker CNW films with a petal structure. These changes in morphology further lead to changes in the structural, optical, and electrical properties of the CNW.
Highlights
Carbon nanowalls (CNWs) are one of the allotropic modifications of carbon and are three-dimensional networks of vertically oriented graphene s heets[1,2]
The energy dispersive X-ray spectroscopy (EDS) analysis of the samples showed that the percentage of the carbon content increases with the increase in the growth time
Since the specific electrical conductivity is normalized by the film thickness, it represents the electrical properties of the film material itself, which should be in correlation with the structural and morphological characteristics of the CNW films obtained from the Raman spectroscopy measurements
Summary
Carbon nanowalls (CNWs) are one of the allotropic modifications of carbon and are three-dimensional networks of vertically oriented graphene s heets[1,2]. We revealed in details the coupling between structural, electronic, optical, and electrical properties of the obtained CNW films with the material growth time during the ICP-PECVD process.
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