Photon-induced near-field electron microscopy: Mathematical formulation of the relation between the experimental observables and the optically driven charge density of nanoparticles

Abstract

Photon-induced near-field electron microscopy (PINEM) enables the visualization of the plasmon fields of nanoparticles via measurement of photon-electron interaction [S. T. Park et al., New J. Phys. 12, 123028 (2010)]. In this paper, the field integral, which is a mechanical work performed on a fast electron by the total electric field, plays a key role in understanding the interaction. Here, we reexamine the field integral and give the physical meaning by decomposing the contribution of the field from the charge-density distribution. It is found that the ``near-field integral'' (the near-field approximation of the field integral) can be expressed as a convolution of the two-dimensional projection of the optically driven charge-density distribution in the nanoparticle with a broad radial response function. This approach, which we call the ``convolution method,'' is validated by applying it to Rayleigh scattering cases, where previous analytical expressions for the field integrals in near-field approximations are reproduced by the convolution method. The convolution method is applied to discrete dipole approximation calculations of a silver nanorod, and the nature of the induced charge-density distributions of its plasmons is discussed.