Abstract
We present innovative near-field test ranges, named compact-near-field (CNF) and very-near-field (VNF). These use photonic probes, and advanced near-field far-field (NFFF) transformations from amplitude and phase (complex) or phaseless measurements. The photonic probe allows AUT-probe distances of less than one wavelength. This drastically reduces test-range and scanner dimensions, improves the signal-to-clutter ratio and the signal-to-noise ratio, and reduces the scanning area and time. In both the cases of complex and phaseless measurements, the neat-field-to-far-field transformation problem is properly formulated to further improve the rejection of clutter, noise, and truncation error. The advantages of the compact-near-field and very-near-field test ranges are discussed and numerically analyzed. Experimental results are presented for both planar and cylindrical scanning geometries.
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