Abstract
N-doped ZnO (NZO) nanocrystalline thin films were successfully synthesized via sol–gel method. The structural and optical properties of the films were characterized by various techniques including X-ray diffraction, atomic force microscopy (AFM), UV–vis absorption and photoluminescence. The UV–vis absorption edge was changed with increasing N-doping concentration. X-ray diffraction (XRD) results clearly showed that the zinc oxide doped with nitrogen (5 to 20 wt.%) were identified with phases of hexagonal ZnO and N-doped ZnO nanocrystalline thin films. The refractive index dispersion mechanism obeys the Single oscillator model. The dispersion parameters E o and E d of the thin films were determined. The dispersion parameters were changed by N dopant. It is evaluated that the structural, optical constants, photoluminescence properties of Zinc oxide film can be controlled by N dopants.
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