Abstract
We investigated surface-potential (SP) undulation on thin films of tris(8-hydroxyquinolinato) aluminum (Alq3) using Kelvin probe force microscopy with intermittent photoexposure. SP undulation with a cloudlike morphology of 200–300 nm in lateral size was observed for Alq3 films of 10–200 nm in thickness. A short photoexposure increased the SP undulation approximately twice as that of the unexposed values, while the SP average decreased monotonically. We analyzed the origin of the SP undulation and the mechanism of its photoenhancement based on its morphology, film thickness dependence, and photoexposure dependence. We suggested nonuniform distributions of mobility and charged traps.
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