Abstract
The T-x phase diagram of the Cu2Te–Al2Te3 semiconductor system was achieved experimentally using 24 different mixtures of the binary compounds. The results of X-ray powder diffraction, differential thermal analysis, and electron microprobe analysis are presented. It was established that only one ternary compound CuAlTe2 exists in this system crystallizing in the tetragonal structure of chalcopyrite with lattice constants at room temperature a = 6.035(5) and c = 11.94(1) A. The maximal homogeneity region of this compound was discovered being limited by compositions with 0.474 and 0.544 molar part of Al2Te3 at 673 K. CuAlTe2 decomposes peritectically at 1,183 K to (Cu2Te)0.97(Al2Te3)0.03 alloy with the structure of Cu2Te and liquid with the composition close to (Cu2Te)0.40(Al2Te3)0.60 which transforms into homogeneous liquid region at 1,240 K.
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