Abstract
Phase detection interferometric microscopy (PDIM) was used to obtain high‐resolution surface images of a 100 μm diam Fe disk exposed to . The initiation and growth of corrosion pits at short times (0–30s) were observed on relatively smooth regions of the Fe surface (rms surface roughness ≈5.5 nm). The growth of pits at open circuit was measured with 1 nm resolution from the time of initiation to depths of 50 nm. The rate of vertical pits growth from PDIM analysis is characterized by the rate equation, , where is the pit depth (nm) and is time (s). The topography of the Fe surface surrounding the pits remained virtually unchanged during pit growth, suggesting the presence of microscopic galvanic cells on the electrode surface.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
